​Spectroscopic Technique  >> Scanning Electron Microscope (SEM)

Scanning Electron Microscope (SEM)

A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons. ​The electrons in the beam interact with the sample, producing various signals that can be used to obtain information about the surface topography and composition.

Scanning Electron Microscopy (SEM) Components
Essential components of all SEMs include the following:

• Electron Source ("Gun")
• Electron Lenses
• Sample Stage
• Detectors for all signals of interest
• Display / Data output devices
• Infrastructure Requirements:
  • Power Supply
  • Vacuum System
  • Cooling system
  • Vibration-free floor
  • Room free of ambient magnetic and electric fields

Applications

• SEM providing morphology information
• Raman for chemical analysis
• Photoluminescence (PL) providing electronic structure information
• Unique cathodoluminescence (CL) signal-collection mode

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Products

Cathodoluminescence (CL)

Raman Spectroscopy