Scanning Electron Microscope (SEM)
ModuleSci provides advanced FE-SEMs based on precision field emission technology and objective lens systems developed in collaboration with the Korea Research Institute of Standards and Science (KRISS).
Modulesci also provides SEM solutions, featuring high-resolution field emission and standard tungsten filament SEMs, competitively priced to deliver exceptional value without compromising on technical performance or scientific precision.
Leveraging our expertise in both electron and light optics, we have commercialised an integrated correlative microscopy system that simultaneously captures electron and optical images. This advanced platform combines the distinctive advantages of optical and fluorescent visualisation with electron microscopy’s nanoscale resolution capabilities.
Contact us for more information.
Modulesci also provides SEM solutions, featuring high-resolution field emission and standard tungsten filament SEMs, competitively priced to deliver exceptional value without compromising on technical performance or scientific precision.
Leveraging our expertise in both electron and light optics, we have commercialised an integrated correlative microscopy system that simultaneously captures electron and optical images. This advanced platform combines the distinctive advantages of optical and fluorescent visualisation with electron microscopy’s nanoscale resolution capabilities.
Contact us for more information.
PicoVision 100 / PV 100 series
The PV-100 is our entry-level Tabletop SEM with a tungsten filament electron source, designed for laboratories where space is at a premium. But the small size doesn’t mean you need to compromise on features. the PV-100 comes with a 5-axis stage, and the new GUI simplifies operation while allowing both novice and expert users to easily obtain high-quality images. With an effective magnification of 70,000×, the PV-100 is ideal for routine imaging at medium and low magnifications.
Table-Top W-SEM |
SPECIFICATIONS
Resolution: 5nm
Magnification: 20 x ~ 300,000 x Effective Magnification: 70,000 x Accelerating Voltage: 1~30kV Motorised Stage: 5 axes (X,Y,Z,T,Θ) Vacuum System: Rotary w/TMP Detectors: SE Standard Detectors Options: SE+EDS SE+BSE SE, BSE & EDS Sample Exchange time within 60 secs |
PicoEye-100 / PE-100 Series
Floor Type W-SEMThe PE-100 is a compact SEM with full-size performance. Supplied with a tungsten filament source, the PE-100 has an effective magnification of over 100,000 ×. Ideal for imaging larger samples due to its oversize chamber, the PE-100 comes with an impressive set of features typically seen on more expensive microscopes, including both a Navigation Camera and a Chamber Camera for increased versatility.
|
SPECIFICATIONS
Resolution: 3nm
Magnification: 20 ~ 300,000X Effective Magnification: 100,000X Accelerating Voltage: 1~30kV Motorised Stage: 5 axes (X,Y,Z,T,Θ) Vacuum System: Rotary w/TMP Detectors: SE Standard Detectors Options: SE+EDS SE+BSE SE, BSE & EDS Sample Exchange time within 60 secs |
PicoEye-300 / PE-300 Series
Entry level FE-SEMThe PE-300 is a Field Emission (Schottky) SEM with high resolution and contrast, allowing users to obtain detailed image information.The PE-30C features our innovative compact FE electron gun made of mild steel with double O-ring sealing providing fast and accurate gun axis adjustment.
With superior quality and a competitive price, the PE-300 is the ideal tool when your application requires high resolution and exceptional imaging. |
SPECIFICATIONS
Resolution: 2nm
Magnification: 20 ~ 300,000X Effective Magnification: 200,000X Accelerating Voltage: 0.5~30kV Motorised Stage: 5 axes (X,Y,Z,T,Θ) Vacuum System: Rotary, TMP & Ion pump Detectors: SE Standard Detectors Options: SE+EDS/SE+BSE SE, BSE & EDS |
|
*Pictures shown above are for reference only. Actual product may differ slightly.
**Some products may not be available in all countries. Please contact us for further information and clarification |
Don't have what you are looking for?
Search Here. Alternatively, please contact us for more information.
|