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​Amplifier and Photoreceiver >> Current Amplifier >> Sub Femto Ampere Sensitivity Variable Gain

​Sub Femto Ampere Sensitivity Variable Gain

DDPCA-300 Data sheet

Model

DDPCA-300

Transimpedance [V/A] 104 105 106 107 108 109 1010 1011 1012 1013
Bandwidth* (-3 dB) [Hz] 400 400 400 400 150 150 20 20 1 1
Rise Time* (10 % - 90 %) [ms] 0.8 0.8 0.8 0.8 2.3 2.3 17 17 350 350
Integrated Input Noise* (Peak-Peak) 7 nA 7 nA 70 pA 70 pA 1.2 pA 1.2 pA 50 fA 50 fA 2 fA 2 fA
Spectral Input Noise Density [/√Hz] 45 pA 45 pA 0.5 pA 0.5 pA 15 fA 15 fA 1.3 fA 1.3 fA 0.2 fA 0.2 fA
Accuracy Performance Gain ±1 %
Adjustable Low Pass Filter 3 settings: full bandwidth, 0.7 Hz and 0.1 Hz
Output Performance ±10 V, ±30 mA
Bias Voltage ±10 V, max. 10 mA, connected to amplifier input, adjustable by trimpot or remote control voltage
Power Supply ±15 V, +70 mA / -15 mA typ., ±150 mA recommended
Control Interface 4 opto-isolated digital inputs, TTL/CMOS compatible, analog bias control voltage input
Case 170 x 60 x 45 mm (L x W x H), Weight 320 g (0.74 lb.)
​* The values for bandwidth, rise time and integrated input noise stated in the table above are achieved with the low pass filter set to full bandwidth. Lower peak-to-peak noise values can be achieved by setting the low pass filter to 0.7 Hz or 0.1 Hz. The minimum peak-to-peak noise of 0.4 fA is achieved in the gain settings 1012 and 1013 V/A with the low pass filter set to 0.1 Hz.

Offset adjustable by trimpot. Overload indication by LED and digital control output. Input protected against ±2 kV transients. Output short-circuit protected. 
​*Pictures shown above are for reference only.  Actual product may differ slightly.  
**Some products may not be available in all countries. Please contact us for further information and clarification.

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  • Products
    • BioTechnologies
    • Cryogenics
    • Deposition Systems
    • Imaging
    • Lasers
    • Wafer Probing
    • Pharmaceutical Testing Apparatus
    • Radiation Detection & Monitoring
    • Spectroscopic System
    • Supporting Instrument & Accessories
    • Surface Characterisation
  • News
  • Instrument demo
  • Customisation
  • Contact Us