Ambient Pressure Photoemission Spectroscopy
Ambient Pressure Photoemission Spectroscopy (APS)
Ambient Pressure Photoemission Spectroscopy (APS) is a system that allows the measurement of large surface analysis.
It contains a dual-mode that allows work function of material by photoemission in air, with no vacuum required. With the addition of a surface photovoltage (SPV) and surface photovoltage spectroscopy (SPS), the full bands of semiconductors can be measured in one system; no other product can do this. APS is ideal for perovskite solar cells, indium zinc tin oxide thin films, diamond electronics, organic solar cells, light-emitting electrochemical cells, organic transistors, alkali oxide thin films, semiconductors. |
SPECIFICATIONS
Energy Range 3.4 eV - 7.0 eV Accuracy 0.05 eV (work function of metals) 0.0001 eV (surface Fermi level) Tip material / diameter 2 mm gold tip CPD resolution 1 - 3 meV Height control (auto) 25 mm automatic |
Ambient Pressure Photoemission Spectroscopy with Nitrogen Environment
This unique APS system allows absolute work function determination in the presence of a nitrogen atmosphere.
This is only made possible with a tuneable deep ultra-violet (UV) source outputting 3.4 - 7.0 eV, for absolute work function and highest occupied molecular orbital (HOMO) measurements, a surface photovoltage spectroscopy (SPS) module outputting 400 - 1000 nm for Voc and Eg measurements, together with a 50 x 50 mm scanning area for planar relative work function measurements (Fermi level). |
SPECIFICATIONS
Energy Range 3.4 eV - 7.0 eV Tip Material / Diameter 2 mm stainless steel tip Absolute Work Function Resolution ≤ 0.05 meV Contact Potential Difference Resolution ≤ 0.001 eV Sample Scanning 50 x 50 mm Height Control 25 mm automatic |
RElated Electronics
Kelvin Probe Systems
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*Pictures shown above are for reference only. Actual product may differ slightly.
**Some products may not be available in all countries. Please contact us for further information and clarification. |
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