probe station
EVERBEING provides wide variety of probe station for all types of scenarios. The probe stations listed below are only a fraction provide from EVERBEING. EVERBEING's probe station are designed to be highly customisable; each probe station can be retrofitted with different (i.e. micropositioners) depending on the user's needs. The number of micropositioners can also be chosen depending on the probe station's capacity.
EVERBEING is also very opened to in providing OEM services for other types of probe stations that are not mentioned below; LCD probe station,LED/PD/LD probe station, Hall effect probe station,etc.
Please contact our professionals to provide your information & specifications for customisation.
EVERBEING is also very opened to in providing OEM services for other types of probe stations that are not mentioned below; LCD probe station,LED/PD/LD probe station, Hall effect probe station,etc.
Please contact our professionals to provide your information & specifications for customisation.
Features | C-Series | EB-Series | BD-Series |
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Chuck Stage | |||
Chuck Up/Down | |||
Microscope Stage | |||
Platen Lift | |||
Platen Fine Adjustment |
millimeter wave probe station
Everbeing’s industry proven mmW probe stations are now available in the international market. Our manual probe stations can fit all brands of frequency extender modules to allow direct connection to RF probes without using additional waveguides from probe to flange.
Available are two versions. EB-6A is specific for Anritsu mmW modules only. All other frequency extenders should use EB-6V. Catalogues are embedded in the links. |
FEATURES
Vacuum Chuck with RF Auxiliary Up to 12" Vacuum Chuck Station Footprint: 760 x 660 (Wx D) Station Weight: 80kg Chuck Stage Type: Coaxial Chuck Travel Range: 6” x 6” Chuck Fine Resolution: 1 µm EB-6A Platen Dimension 250 mm Inner, 450mm Outer EB-6B Large Micropositioners for Mounting VDI, OML, RS, Keysight Extenders Platen Dimension 120 x 180 mm (North & South) |
Industrial Grade
FEATURES
BD Series Platen Up/Down Coarse Adjustment (6 mm), Lever Driven Fine Adjustment (25mm), Hand Wheel Driven Platen Size Up to 12 Micropositioner Microscope Stage 1x1" Travel Chuck Stage 6″, 8″, 12″ Chuck Size Vacuum Chuck 8" (BD-8)/ 6" (BD-6) Stainless Steel Chuck Theta 0-30° Dimensions 780x660x700mm (WxDxH)(w microscope) Weight 80kg (w microscope) Backlash-Free Movement |
FEATURES
EB Series Chuck Up/Down 4mm Adjustable Platen Size Up to 12 Micropositioner Microscope Stage 1x1" Travel Chuck Stage 4", 6″, 8″, 12″ Chuck Size Vacuum Chuck 8" (BD-8)/ 6" (BD-6) Stainless Steel Chuck Theta 0-30° Dimensions 660x660x700mm (WxDxH)(w microscope) Weight 80kg (w microscope) Backlash-Free Movement |
Educational Grade
Generally, the smaller and more compacted probe stations are better suited for educational purpose.
The C series contains all the functionalities as of the other series, all while being extremely compacted. It is the ideal solution for users with spatial constraints or a need a portable probe station ( can be hand-carried overseas).
The C series contains all the functionalities as of the other series, all while being extremely compacted. It is the ideal solution for users with spatial constraints or a need a portable probe station ( can be hand-carried overseas).
FEATURES
C Series Chuck Up/Down 6mm Adjustable Chuck Theta 15° (Backlash-Free Movement) Vacuum Chuck Up to 12" (with seperate vacuum switch) Platen Size 4-6 Micropositioner Chuck Stage 4", 6″ Chuck Size Fine Position 10 micron resolution Quick Motion 25 mm drive per knob Dimensions 500x450x550mm (WxDxH)(w microscope) Weight 32kg (w microscope) |
FEATURES
C-2 Series Chuck Up/Down 6mm Adjustable Chuck Theta 15° (Backlash-Free Movement) Vacuum Chuck 2" (with seperate vacuum switch) Chuck Stage 4", 6″ Chuck Size Fine Position 10 micron resolution Quick Motion 25 mm drive per knob resolution Dimensions 320x320x320mm (WxDxH)(w microscope) Weight 15kg (w microscope) Accommodates 6 DC micropositioner 4 RF micropositioner |
Low-Temperature Probe Station
RF Probe Station
The C-2-RF is a modification of the C-2-mini series into a revolutionary RF testing station with with 4-port with DC biasing capability.
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FEATURES
C-2-RF Lightweight 26kg (portable) Compacted footprint 360 mm x 330 mmn, glovebox compatible. 4-port Measurement up to 70 GHz and 2 DC bias X&Y Chuck Hot & Cold Chuck; -60℃~200℃ Quick Y&Z Chuck Y slide pin for easy wafer loading Z for contact place and release U-Chuck Holds DUT & calibration substrate simultaneously with individual vacuum switches 1 µm resolution X-Y-Z linear motion micropositioners with magnetic on/off switch Integrated Vibration Isolator |
EB CHAMBER PLUS PROBE STATION
The Chamber Plus probe station offers a sealed environment for an oxygen-free environment and double as a Faraday cage enclosure for extreme limits for probing. While the DUT is enclosed within the chamber, all probing operations such as chuck stage movement, micropositioning, are still readily available.
With this product you can achieve the following into your test:
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FEATURES
Station Footprint
760 x 660 mm (WxD) Station Height 450 mm (to Platen) 700 mm (to Microscope) No. of Vacuum Switches 4 Platen Dimension 250mm (Inner) 450 mm (Outer) Chuck Travel Range 6" x 6" Chuck Fine Resolution 1 μm Chuck Theta Fine Resolution 0.01° |
EB PCB Probe Station
The EB PCB Probe Station combines mechanical expertise from our flagship probe station and broadens the test parameters to large scale devices such as PCB’s and LCD panels. All stations are set on a vibration free table.
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FEATURES
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Related Instruments
*Pictures shown above are for reference only. Actual product may differ slightly.
**Some products may not be available in all countries. Please contact us for further information and clarification. |
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