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Products ​>> Wafer Probing >> Probe Stations & Equipments >> High Impedance Probes

High Impedance Probes

Model 12C


Picture
Picoprobe Model 12C is a high speed, high input impedance active probe for measuring the internal node voltage of integrated circuits.
The input is 1 megohm shunted by 0.1 pf and the rise/fall times are 0.8ns.

​This instrument has full dc capability and can be used with any
oscilloscope. The Model 12C was specially designed so that when used in conjunction with a high input impedance oscilloscope signal
attenuation is 10:1 and with a 50 Ohm input signal attenuation is 20:1.​
​
Model 12C
FEATURES

Input Capacitance
0.1pf

Input Resistance
1.0 megohm

Rise/Fall Time 
0.8ns

Bandwidth
dc to 500 MHz

Linearity 
0.5%

Voltage Range 
-10 to +20V*

Gain Accuracy 
±3%

Signal Attenuation 
(High input impedance oscilloscope)
10 to1
(50 ohm input) 20 to 1

GGB PicoProbe Model 34A


Picture
The Picoprobe Model 34A has been engineered to meet the stringent demands of advanced high frequency circuit designers. This probe combines full DC capability, rise/fall times of 120 ps, and a nominal loading input impedance of 10 MΩshunted by 0.1 pf. Signal attenuation is 20:1 with a 50 ohm oscilloscope input.

Like our other active probes, the Model 34A achieves its bandwidth using just one probe point, which greatly simplifies internal node testing without sacrificing performance.
Model 34A
​FEATURES
​

Input Capacitance
0.1pf

Input Resistance
10.0 MΩ

Rise / Fall Time
120 ps (5 V pulse)

Frequency Response
DC to 3 GHz (-3 dB)

Operating Range
-7V to +10V

Linearity
0.5 %

Gain Accuracy
+3.0 %

Signal Attenuation
20 : 1

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*Pictures shown above are for reference only.  Actual product may differ slightly.  
**Some products may not be available in all countries. Please contact us for further information and clarification.

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  • Products
    • BioTechnologies
    • Cryogenics
    • Deposition Systems
    • Imaging
    • Lasers
    • Wafer Probing
    • Pharmaceutical Testing Apparatus
    • Radiation Detection & Monitoring
    • Spectroscopic System
    • Supporting Instrument & Accessories
    • Surface Characterisation
  • News
  • Instrument demo
  • Customisation
  • Contact Us