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 Imaging >> Scanning Electron Microscope (SEM) >> Instruments

Scanning Electron Microscope (SEM)

SELPA


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​SELPA(Scanning ELectron Microscope for Particle Analysis) is an automated large area particle analyzer, which is developed based on SEM(Scanning Electron Microscope)

In industrial application, it can be used to analyze and classify the particles by their various size and element, the strength of SELPA is that the large area mapping is possible. Also, SELPA can analyze particles under 2.5um, it's a SEM/EDS automated system which can get the results of elements distribution of selected area. 
SELPA
​FEATURES
Electron Gun
Pre-centered Cartridge

Source
Tungsten (W)

Magnification
x60 to x5,000

Acceleration Voltage
1 to 30kV (1kV increment)

Detector
BSED(DP)

Stage
X: 100mm (Motorized)
Y: 100mm (Motorized)
Z: 12 to 40mm (Motorized)

EM-30N : Benchtop SEM


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The EM-30N is the ultimate benchtop SEM, with N meaning the unlimited potential of discovery of physical & biological worlds. 

​The EM-30 series is best for applications with spatial restriction or applications for smaller samples. 
EM-30N
FEATURES

Dimension
400 x 600 x 550 mm

Weight
85kg​

Resolution
<5nm (EM-30N EM-30Plus EM-30AXPlus)
<15nm (​EM-30 EM-30AX)

Options
STEM

EM-30 PLUS : BENCHTOP SEM


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The EM-30 series is best for applications with spatial  restriction or applications for smaller samples. 
EM-30PLUS
FEATURES

Dimension
400 x 600 x 550 mm

Weight
85kg​

Magnification
20-150,000X 

Resolution
<5nm (EM-30N EM-30Plus EM-30AXPlus)
<15nm (​EM-30 EM-30AX)

EM-30 : BENCHTOP SEM


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The EM-30 series is best for applications with spatial  restriction or applications for smaller samples. ​
EM-30
FEATURES

Dimension
400 x 600 x 550 mm

Weight
85kg​

Magnification
20-100,000X 

Options
BSED

CX-200PLUS: Full SEM System


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CX-200PLUS is a full & holistic SEM system including a software system with a greater magnification level as compared to the benchtop model. It is ideal for larger specimens (up to 160mm diameter) or when space is not a restriction.

The CX-200PLUS also has a more adjustable X,Y & Z axis to allow the application to be much faster & more accurate.  It is ideal for applications such as signal mixing with up to 3nm resolution. 

CX-200PLUS  provides multiple useful techniques such as SE, BSE, and cool stage, making it ideal to investigate morphological structures of biological specimens.
FEATURES

Compact and Strong Performance

Resolution
<3nm
​
Standard SE, BSE Detector

Standard Chamber Scope

Standard Panorama

Signal Mixing

Fully Compatible EDS

​10 Ports for Third party​
SEM Specification Comparison

related instrument


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Optional Products
*Pictures shown above are for reference only.  Actual product may differ slightly.  
**Some products may not be available in all countries. Please contact us for further information and clarification.

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Tel : +65-67468068
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Email:  singapore@analytical-online.com
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  • Products
    • BioTechnologies
    • Cryogenics
    • Deposition Systems
    • Imaging
    • Lasers
    • Wafer Probing
    • Pharmaceutical Testing Apparatus
    • Radiation Detection & Monitoring
    • Spectroscopic System
    • Supporting Instrument & Accessories
    • Surface Characterisation
  • News
  • Instrument demo
  • Customisation
  • Contact Us