SEM Optional products
Cross Section Polisher
The cross section polisher (CP) uses an argon ion beam to polish surfaces of a specimen
As accelerated Ar ion beam reaches the sample in the vacuum condition, atoms of sample surface separate from it. The cross section polisher is most ideal for mechanical & ion beam polishing. |
FEATURES
Milling Speed 150 μm/h (Si at 5kV) Accelerating Voltage 2~8 kV Beam Diameter Approx. 500 μm Working Pressure 2.0 x 10-4 torr Maximum Sample Size 20(W) x 12(D) x 7(H)mm Sample Moving Range (Z: ±2mm, Y: ±2mm) Rotation -35° ~ +35° |
Ion Sputter Coater
The ion coater, SPT-20, is a device used for coating conductive materials (Au, Pt, Pd, Pt-Pd) (AU&PT-guarantee) onto the sample surfaces by using DC sputtering principle.
Non-conductive samples are also used for observation under electron microscopes, and they are used to protect the sample surfaces from the injected electron beam and to help the electron flow. It can be used as an electrode formation of thin film type too. |
FEATURES
Target Size 50mm Power AC 110-240V, 50/60Hz, 50W (except rotary pump) Ionization Current 0~9mA Chamber Size 100mm [Dia] Dimension 420(W)*220(D)*230(H)mm |
STEM
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STEM is an analysis tool used to generate transmission images using table-top ‘Scanning Electron Microscope’ (SEM); by detecting electrons that had been projected onto a specimen in a two-dimensional manner through electron beams generated by an electron gun.
This tool is most ideal for ‘life sciences’ field to observe the information of cells beneath the surface and their structure and, in material science, nanostructures by using its small braille beams and rich luminance. |
Cool Stage
Cool stage is a device that assists to very rapidly freeze liquid samples or samples holding moisture to maintain the current state so that they can be filmed effectively.
The cool stage can also be heated to cater for various samples according to temperature changes observed in real time. |
FEATURES
Cool Stage Temperature -25˚C to 50 ˚C Temperature Resolution ± 0.1 ˚C Temperature Accuracy ±1 ˚C Tolerance Water Temp.(Chiller) +5 ˚C ~ +8 ˚C Specimen Holder Size 18ø |
BSE Detector
Backscattered electrons (BSEs) are high-energy electrons generated as a result of elastic interactions between the primary electron beam and the sample.
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FEATURES
4 Channel Semiconductor Type BSE Detector Clear Image about the boundary of metal Optional for both of EM Series and CX Series Easily controlled S/W by Digital board Clear Image of Non-Coating Specimen with LV mode |
related instrument
Scanning Electron Microscope (SEM)
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*Pictures shown above are for reference only. Actual product may differ slightly.
**Some products may not be available in all countries. Please contact us for further information and clarification. |
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