Atomic Force Microscope (AFM)
The myriad of AFM (Atomic Force Microscope) techniques that allow study of topographical, electrical and mechanical properties can be performed with any laser source available in Raman spectrometer, or with other external illumination (e.g., solar simulator or other tunable or continuum source).
TERS (Tip-Enhanced Raman Spectroscopy) and TEPL (Tip-Enhanced PhotoLuminescence)can provide nano-scale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
TERS (Tip-Enhanced Raman Spectroscopy) and TEPL (Tip-Enhanced PhotoLuminescence)can provide nano-scale chemical and structural information, making the AFM-Raman platform a two-way road; where complimentary techniques provide novel and unique imaging capabilities to each other.
SmartSPM
The SmartSPM (Scanning Probe Microscope) is the first 100% automated system that offers its cutting-edge technology of ultra-fast, metrological and high-resolution measurements for the most advanced materials research at the nanoscale in all AFM and STM (Scanning Tunnelling Microscope) modes.
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SPECIFICATIONS
Sample Scanning Range 100 µm x 100 µm x 15 µm (±10 %) Scanning Type by Sample XY non-linearity 0.05 %; Z non-linearity 0.05 % Noise < 0.1 nm RMS in XY dimension in 200 Hz bandwidth with capacitance sensors on; < 0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off; < 0.04 nm RMS Z capacitance sensor in 1000 Hz bandwidth Resonance Frequency XY 7 kHz (unloaded) Z: 15 kHz (unloaded) X, Y, Z Movement Digital closed loop control for X, Y, Z axes; Motorized Z approach range 18 mm Sample Size Maximum 40 x 50 mm, 15 mm thickness Sample Positioning Motorized sample positioning range 5 x 5 mm |
CombiScope
The CombiScope Atomic Force Microscope (AFM) is an advanced research instrument that provides the entry path for researchers in biology, spectroscopy and photonics.
It perfectly combines inverted optical and atomic force microscopies and unleash all the power of both techniques providing the instrument adjustment and measurement automation, high resolution and high speed. |
SPECIFICATIONS
Sample Scanning Range 100 µm x 100 µm x 20 µm (±10 %) Scanning Type by sample XY non-linearity 0.05 % Z non-linearity 0.05 % Noise 0.1 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors on 0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off < 0.1 nm RMS Z capacitance sensor in 1000 Hz bandwidth Resonance Frequency XY: 7 kHz (unloaded) Z: 15 kHz (unloaded) Manual Sample Positioning range 25x25mm positioning resolution 1um Motorised SPM Measuring Head Positioning 1.6 x 1.6 mm positioning resolution 1um |
OmegaScope
The OmegaScope is a state-of-the-art turn-key solution that combines Optics and ultra-resolution multi-range research AFM.
The OmegaScope AFM is an advanced research instrument that provides path for researchers in spectroscopy and photonics. It is available in reflection configurations providing direct top and side optical access. The flexibility of the OmegaScope platform offer almost endless possibilities in correlation of high spatial resolution spectroscopies (Raman, Photoluminescence, Fluorescence) and AFM imaging modes. |
SPECIFICATIONS
Sample Scanning Range 100 µm x 100 µm x 15 µm (±10 %) Scanning Type by Sample XY non-linearity 0.05 % Z non-linearity 0.05 % Noise 0.1 nm RMS in XY dimension in 200 Hz bandwidth with capacitance sensors on 0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off < 0.04 nm RMS Z capacitance sensor in 1000 Hz bandwidth Resonance Frequency XY: 7 kHz (unloaded) Z: 15 kHz (unloaded) X, Y, Z Movement Digital closed loop control for X, Y, Z axes; Motorized Z approach range 18 mm Sample Size Maximum 40 x 50 mm 15 mm thickness Sample Positioning Motorised sample positioning range 5 x 5 mm Positioning Resolution 1 µm |
Raman microscopes, but also your iHR spectrometers, can all be upgraded to with the integration of our AFM and its optical platform
related Instruments
AFM-Raman
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*Pictures shown above are for reference only. Actual product may differ slightly.
**Some products may not be available in all countries. Please contact us for further information and clarification. |
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