AFM-Raman
Coupling these 2 technologies from HORIBA means having the full power of Raman, Photoluminescence, AFM, Tip-Enhanced Raman Spectroscopy (TERS), Tip-Enhanced Photoluminescence (TEPL), and many other AFM modes correlated with spectroscopic measurements, all together on the same AFM-Raman integrated platform. This provides a unique technique for the characterization of molecules, 1D and 2D materials, semiconducting nanostructures and bio-materials.
All AFM-Raman spectroscopy systems are capable of analysing its samples just within minutes (not hours!)
All AFM-Raman spectroscopy systems are capable of analysing its samples just within minutes (not hours!)
Enhance AFM with Chemical Identification
SignatureSPMSignatureSPM is the first microscope built on a multimodal characterisation platform, integrating an automated Atomic Force Microscope (AFM) with a Raman/Photoluminescence spectrometer, enabling true colocalised measurements of physical and chemical properties.
Through the combined physical and chemical knowledge obtained in a single, and real-time measurement, the researcher can obtain a reliable and comprehensive analysis of the sample, with a shortened time to knowledge as a result of lesser sample handling and a data acquisition of with a high confidence level, thanks to the correlation of difference measurements. |
SPECIFICATION
Sample scanning range
100 µm x 100 µm x 15 µm (+/-10%) Non-linearity XY < 0.05% Z < 0.05% Noise < 0.1 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors on < 0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off < 0.1 nm RMS in Z dimension in 1000 Hz bandwidth with capacitance sensor on < 0.03 nm RMS in Z dimension in 1000 Hz bandwidth with capacitance sensor off Resonance frequency XY: 7 kHz (unloaded); Z: 15 kHz (unloaded) Open loop XY drift < 0.5 nm / min Maximum sample size 40 mm x 50 mm, 15 mm thickness Motorised sample positioning range 5 mm x 5 mm Motorised approach range 17 mm |
Versatile AFM Optical Coupling
TRIOSThe TRIOS platform is an advanced research instrument that provides the entry path for researchers in materials science, biology, spectroscopy and photonics. TRIOS is the most versatile optical coupling platform providing three ports for optical spectroscopy measurements with top-down, side (oblique) and inverted accesses to the AFM tip and sample.
TRIOS can be easily combined to our turn-key Raman/PL systems for co-localized AFM-Raman/PL measurements, Scanning Near-Field Optical Microscopies (SNOM), and Tip-Enhanced Optical Spectroscopies (TERS: Tip-Enhanced Raman Spectroscopy and TEPL: Tip-Enhanced Photoluminescence). |
SPECIFICATION
Sample scanning range
100 µm × 100 µm × 15 µm (+/-10%) Optional scanning range 200 µm × 200 µm × 20 µm (+/-10%) Non-linearity XY < 0.05%, Z < 0.05% Noise < 0.1 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors on < 0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off < 0.1 nm RMS in Z dimension in 1000 Hz bandwidth with capacitance sensor on < 0.03 nm RMS in Z dimension in 1000 Hz bandwidth with capacitance sensor off X, Y, Z movement XY resonance frequency 7 kHz (unloaded) Z resonance frequency 15 kHz (unloaded) Digital closed loop control for X, Y, Z axes |
AFM - Raman System with Tip Enhanced Raman Spectroscopy (TERS)
xplora nanoXploRA Nano is a fully integrated compact AFM-Raman System. It combines high performance with ease-of-use, speed & reliability.
Compact, fully automated and easy-to-use, the XploRA Nano concentrates the power of AFM-Raman into an affordable yet full-featured package, making TERS imaging a reality for all. The TERS proven system. |
SPECIFICATIONS
Sample scanning range 100 µm x 100 µm x 15 µm (±10 %) Scanning type by sample XY non-linearity 0.05 % Z non-linearity 0.05 % Noise 0.1 nm RMS in XY dimension in 200 Hz bandwidth with capacitance sensors on; 0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off; < 0.04 nm RMS Z capacitance sensor in 1000 Hz bandwidth Sample size Maximum 40 x 50 mm, 15 mm thickness |
labram hr nanoFully integrated system based on SmartSPM state of the art scanning probe microscope and LabRAM HR Evolution fully automated Raman micro-spectrometer.
LabRAM HR Nano offers full automation and versatile compatibility with outstanding performance. |
SPECIFICATIONS
Sample Scanning Range 100 µm x 100 µm x 15 µm (±10 %) Scanning Type by Sample XY non-linearity 0.05 % Z non-linearity 0.05 % Noise 0.1 nm RMS in XY dimension in 200 Hz bandwidth with capacitance sensors on; 0.02 nm RMS in XY dimension in 100 Hz bandwidth with capacitance sensors off; < 0.04 nm RMS Z capacitance sensor in 1000 Hz bandwidth Sample Size Maximum 40 x 50 mm, 15 mm thickness |
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Related Instruments
Atomic Force Microscope (AFM)
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Raman Microscope
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*Pictures shown above are for reference only. Actual product may differ slightly.
*Some products may not be available in all countries. Please contact us for further information and clarification. |
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