​Products >> Wafer Probing >> Parallel Test Systems

PARALLEL TEST SYSTEMS

AixHALT

HALT stands for “Highly Accelerated Lifetime Testing”. As piezoelectric thin films become suitable for series production and are used in an increasing number of applications, being able to test their durability is vital. Performing such lifetime tests requires the systems to be subjected to accelerated aging, as the mechanisms behind this process in thin films are not yet fully understood. We must therefore investigate a larger parameter space in order to enable statistically reliable analyses. Each of the various test parameters, from temperature, voltage and frequency to signal form, humidity and more, must be measured with a high number of samples. Until recently, this was a time-consuming process.

We developed aixHALT to speed things up. With its modular design, this parallel test system lets users measure virtually any number of samples simultaneously. This accelerates the process, while quickly leading to reliable results.
FEATURES

Output voltages:
 +/-12V, 150mApk,
250kHz, 50 Ohm output impedance

Optional module(internal):
+/-100V, 50mA, (10nF@10kHz) or
+/-200V, 20mA, (10nF@2kHz)
Optional external power amplifier support (output, voltage monitor, enable)

Optional external amplifier module
 +/-100V, 500mArms, 100kHz (load dependent);
​200V and 400V module also available

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​*Pictures shown above are for reference only.  Actual product may differ slightly.  
**Some products may not be available in all countries. Please contact us for further information and clarification.
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