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​Products >> Wafer Probing >> Thin-film Memory Products

tHIN FILM & MEMORY pRODUCTS

TF analyser series

Based on the idea of a modular and flexible designed measurement system, the TF Analyzer platforms helps to close the gap; between pure electrical testing, with reduced requirements and high specialised testing solutions for production control developed a variety of Analyser platforms across the entire series.

TF 1000

thin film memory products singapore
The ferroelectric test system TF Analyzer 1000 is designed to allow various measurements on ferroelectric materials to determine its main electric characteristics.

​The TF Analyser 1000 includes a built-in function generator, an analog input board, and a wide bandwidth virtual ground amplifier with driving unit. This system offers hysteresis measurements from 0.1 Hz to 1000 Hz bandwidth; depending on the excitation voltage in virtual ground mode.
TF 1000
FEATURES
  • Dynamic Hysteresis measurement 
  • Fatigue measurement
  • Retention measurement
  • Imprint measurement 
  • Leakage current measurement and optional
  • C(V) measurement 
  • Piezo measurement 
  • Pulse Measurement
  • Static Hysteresis measurement 

TF2000

Picture
The TF Analyser 2000 E is one of the most sophisticated analyser of electroceramic material and devices. The test equipment is based on a modular idea, where four different probe heads can be connected to one and the same basic unit. Each of the four probe heads represents a different characterisation method.

The ferroelectric test module (FE module) is designed to perform various measurements on ferroelectric materials to determine its main electronic characteristics.

​The system can control and operate with different external hardware equipment, such as temperature units, probing stations, high voltage amplifiers, laser interferometers etc. Communication via serial interface, IEEE interface, or Ethernet is supported.
TF 2000
FEATURES
 
Ferroelectric standard testing
(FE Module)
Hysteresis measurement
PUND measurement
Fatigue measurement
Retention measurement
Static hysteresis measurement
Imprint measurement
Leakage current measurement 

Magnetoresistive & ferroic material testing
(MR Module)

 
Relaxation current measurement module
(RX Module)

Self discharge testing module
(DR Module)

​TF 3000

Picture
Offering the highest frequency ranges,  TF Analyser 3000 is the flagship of the TF Analyser family. Without any restrictions regarding input resolution, TF 3000  is the ideal partner for dedicated high speed testing of electro ceramic material and devices. 

The TF Analyzer is also used in High Speed PES and CMA systems. The test equipment is based on the same modular idea like the TF2000E, where several different probe heads can be connected to one and the same basic unit. 

The test equipment is based on the same modular idea like the TF2000E, where four different probe heads can be connected to one and the same basic unit. Each of the four probe heads represents a different characterisation method. In combination with the FE-Module enhanced it offers a 1MHz frequency range for hysteresis measurement of ferroelectric materials.
TF 3000
SPECIFICATIONS

 ​Output Channel
Arbitrary waveform generator up to 100 Ms/s(*CMA
option: additional 16bit Arbitrary Waveform generator) 
1000 points in 10µs

Pulsewidth
down to 50ns

Amplifier
150V built-in amplifier with 1MHz bandwidth (optional)

Analog Input channels:
Up to 40MS/s, +/- 10V, 16 bit

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​*Pictures shown above are for reference only.  Actual product may differ slightly.  
**Some products may not be available in all countries. Please contact us for further information and clarification.

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  • Products
    • BioTechnologies
    • Cryogenics
    • Deposition Systems
    • Imaging
    • Lasers
    • Wafer Probing
    • Pharmaceutical Testing Apparatus
    • Radiation Detection & Monitoring
    • Spectroscopic System
    • Supporting Instrument & Accessories
    • Surface Characterisation
  • News
  • Instrument demo
  • Customisation
  • Contact Us